SEEcrets Revealed: Photodiode Space Radiation Vulnerability Exposed Through Pulsed-Laser Single Event Effect Testing
Space electronics are vulnerable to radiation-induced errors, a major error being Single-Event Effects (SEE). Traditional testing uses heavy-ion or proton beams; however, these are costly, hard to access, and lack spatial resolution. Pulsed-laser systems bridge those gaps with micron-scale targeting, precise timing, lower costs, and in-situ probing. This experiment aims to identify areas on an OSD15-5T, a silicon photodiode, sensitive to SEE phenomena and to categorize this component's response to Space-like radiation.